Dual Beam Focused Ion Beam / Scanning Electron Microscope (FIB/SEM)
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34K views · 1.4K reactions | ION Beam Analysis: From da Vinci to the Hubble Telescope Ion beam analysis is a family of analytical techniques which use an MeV ion beam to probe the composition of a sample at sub-micron dimensions. This suite of techniques can provide information on light and heavy elements, as well as molecular information. It also allows for mapping and profiling of the sample as a function of depth. Check it out: | Sci Ani | Facebook
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