Variation is becoming a bigger problem in multi-die assemblies with TSVs and hybrid bonding. Multi-modal approaches are required to test these devices. AI plays a role in improving defect capture rate ...
Ultra Fast 20Gbps USB 3.2 Gen 2×2 Camera Type C | Onsemi AR1335 Color Camera | ROI Based Autofocus and Auto Exposure | ...
WILMINGTON, N.C. (WECT) - February is Heart Health Month and next week begins Congenital Heart Defect Awareness Month. Dr. Lance Lewis, a cardiologist with Novant Health, was in the studio to discuss ...
Powered by Infineon FX20 and Onsemi HyperLux AR2020, Vajra-2020MRS streams uncompressed 20 MP over USB-C, delivering low-latency 5K-class imaging on native UVC without PCIe frame grabbers.” — Ashu ...
Vitrek, a US-based manufacturer of high-precision test and measurement equipment, offers the 95X Series hipot tester with 100 pico-amp leakage current resolution for detecting micro-level insulation ...
A hipot tester works by applying high voltage to a device under test and measuring how much electrical current leaks through its insulation. In medical implantable and aerospace avionics, allowable ...
Korean researchers have developed a new analysis method capable of detecting “hidden defects” in semiconductors with a sensitivity approximately 1,000 times higher than that of existing techniques.
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