Semiconductor Engineering

Enabling Seamless Monitoring, Test, And Repair In Multi-Die Designs

Multi-die design using 2.5D and 3D technologies has emerged as a necessity to keep the pace of innovation. For all their ...
Ahmedabad Mirror

From Painful Testing to Smart Monitoring: How Scanbo is Transforming Chronic Care Through Non-Invasive Diagnostics - By Ashissh Raichura

Chronic disease care depends on consistent, reliable, and structured monitoring. Traditional testing methods can sometimes be ...
Electronic Design

Design-For-Test The Smart Way: dFT With A "Big T" And A "Little d"

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Semiconductor Engineering

Making The Most of Test Resources

Semiconductor testing is undergoing multiple paradigm changes at once with the common goals of producing more known good die per month with low test cost. Achieving these goals requires a delicate ...