Imagine a world where you could change the designs you see on bags, shirts, and walls whenever you want. Typical clothes ...
Abstract: This article presents a novel fault diagnosis method for open-circuit faults of insulated gate bipolar transistors (IGBTs) and current sensor faults in three-phase sinusoidal pulsewidth ...
Abstract: This paper presents a CMOS binary neural network architecture specifically aimed to perform inferences on CMOS image sensors. The circuits is based on a pipelined structure which exploits ...
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