Abstract: Emerging transistors lack the statistical compact models needed to evaluate the yield of integrated circuits. To address this, we propose a novel framework combining a variational ...
To move forward, they must stack transistors vertically and power them from within the silicon itself. The boldest ...
Abstract: We describe a method for the creation of a compact model for local layout effects (LLEs) using pixelated images of the layers of physical layouts as input features. We incorporate these ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results