Defect detection automated in diamond, other advanced semiconductors

Materials scientists at Rice University have developed a new workflow methodology for measuring microscopic defects in ...
Nature

Metal surface defect detection using SLF-YOLO enhanced YOLOv8 model

This paper addresses the industrial demand for precision and efficiency in metal surface defect detection by proposing SLF-YOLO, a lightweight object detection model designed for resource-constrained ...
Nature

Real-time defect detection in concrete structures using attention-based deep learning and GPR imaging

As the backbone of modern infrastructure, concrete structures serve as critical load-bearing elements in bridges, dams, and high-rise buildings worldwide. However, these essential components are ...
Semiconductor Engineering

Nearly Invisible: Defect Detection Below 5nm

Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...
Semiconductor Engineering

Hunting For Macro Defects

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...