A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...

Effective stereo microscope selection depends on understanding application demands and the performance factors that affect 3D ...

Researchers have proposed a new method to form an electron lens that will help reduce installation costs for electron microscopes with atomic resolution, proliferating their use. Instead of the ...

Abbe test plate (for checking the spherical and chromatic aberration of microscope objectives) of the later strip form by Carl Zeiss, Jena. In fitted box with sector stop and instructions Abbe test ...

IBM Corp. and Nion Co. said today their researchers have developed technology that allows them to look deep inside materials and view atoms interacting in different environments – at a resolution the ...

This year, the electron microscopy community marks the 25 th anniversary of the release of the first aberration-corrected transmission electron microscope. To celebrate the occasion, this article ...

Left: Images of fluorescent particles that are above, at and below (top to bottom) the vertical position of best focus of a microscope. Calibrating the effects of lens aberrations on the apparent ...

Researchers have shown that expensive aberration-corrected microscopes are no longer required to achieve record-breaking microscopic resolution. Researchers at the University of Illinois at ...

(Nanowerk News) Electron microscopy enables researchers to visualize tiny objects such as viruses, the fine structures of semiconductor devices, and even atoms arranged on a material surface. Focusing ...