Business Wire

Keithley Adds Support for Non-Volatile Memory, Very Low Frequency C-V, and Increased Parallel Testing to Semiconductor Parameter Analyzer

CLEVELAND--(BUSINESS WIRE)--Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced a variety of enhancements for its award-winning Model ...
EDN

Handbook explains parallel parametric testing

Keithley Instruments has announced the publication of Parallel Test Technology: The New Paradigm for Parametric Testing, a handbook that covers semiconductor parametric testing. The free, 60-page book ...
Semiconductor Engineering

Time For Massively Parallel Testing

Time is money in electronics, as in other industries, and the more time that is invested in testing chips means more costs being added to the product in question. To speed up testing for memory ...
Semiconductor Engineering

Site-To-Site Variation In Parallel Test

From wafer to system level test, parallel test execution delivers significant benefits, including reduced costs, yet it’s never as simple as that PowerPoint slide you present to management. An ...
Business Wire

Presto Engineering’s Extensive Test Capabilities Enable It to Offer Customers Parallel Testing of Automotive Products to Provide Much Faster Time to Market

SAN JOSE, Calif.--(BUSINESS WIRE)--Automotive electronics testing is one of the most exacting of all test and qualification protocols before production release because of the safety and liability ...
EDN

REVIEW: Parametric testers pack asynchronous, synchronous parallel capabilities

SANTA CLARA, Calif.—Agilent Technologies Inc. introduces its next-generation parametric test platform, which is designed to meet the evaluation needs of engineers working in semiconductor fabs and ...