Loaded board testing pays for itself by reducing field returns and bone-pile scrap. You seldom read an article about PCBs or semiconductors without encountering test-related phrases and acronyms. Cost ...

Traditional electronic test methodologies often have combined different items of discrete test equipment to verify product functionality at the design stage with expensive ATE used to support volume ...

Folks from [Adafruit] are showing off a neat hack – USB host on RP2040, using the now-famous PIO peripheral. [Adafruit] builds a lot of RP2040 boards, and naturally, you gotta test them before you ...

I noted in a 2005 column (see "Current compression test methods" under “Editor's Pick,” at top right) that there are three basic methods of loading a composite material test specimen in compression: ...

This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...

Anritsu Company announced the Universal Fixture Extraction (UFX) option for its VectorStar® vector network analyzers (VNAs) to provide signal integrity with an increased range of on-wafer and fixture ...