EDN

Keithley combines DC and RF parametric test

Targeting characterization of communications and high-speed digital devices at the wafer level, the Model S600DC/RF APT (automated parametric test) system from Keithley Instruments (Cleveland, OH, www ...
Semiconductor Engineering

Hybrid System-Level Test For RF SiP

The IoT represents a rapidly growing market for which high-speed wireless connections suitable for various usage systems are indispensable. The arrival of digital transportation is accelerating this ...
Nasdaq

Keysight’s New Parallel Parametric Test System Delivers High Throughput and Cost-Effective Wafer Test

SANTA ROSA, Calif.--(BUSINESS WIRE)-- Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
EDN

Keithley teams with probe supplier GGB to offer wafer-level parametric testing

CLEVELAND — Keithley Instruments Inc. here has entered into a partnership with GGB Industries Inc. of Naples, Fla., to share technical and marketing support for each other's products in semiconductor ...
Electronic Design

Accelerate System-Level Analysis With Upfront RF Planning

1. The traditional Excel spreadsheet approach to system-level will include analysis component mismatches and phase noise. 2. Here, the Visual System Simulator (VSS) is co-simulated with the Microwave ...
Electronic Design

Next-Generation RF Device Test Performance Challenges

This is the second article of a three-part series discussing the likely impacts of next-generation consumer wireless semiconductor devices on instrumentation performance requirements. The first ...