The semiconductor industry is evolving with quantum imaging and AI-driven technologies, enhancing defect detection and ...

HWASEONG, South Korea, March 5, 2026 /PRNewswire/ -- With accelerating global investment in AI infrastructure and surging demand for High Bandwidth Memory (HBM) and AI chips, the need for more precise ...

Recently, defect detection systems using artificial intelligence (AI) sensor data have been installed in smart factory manufacturing sites. However, when the manufacturing process changes due to ...

A research team affiliated with UNIST has unveiled an innovative, high-precision AI-powered quality inspection system that reduces inspection time from 12 minutes to just under 3 seconds. This cutting ...

The India Electronics and Semiconductor Association (IESA), in a landmark collaboration with GlobalFoundries (GF) India, one of the world's largest feature-rich semiconductor foundries, NXP ...

When contamination defects surface in advanced nodes, the root cause often spans tools, materials, and handling. This piece outlines how defect mapping, TEM, and SPC data converge to prove causation.

Photo-induced force microscopy (PiFM) is a sophisticated nanoscale characterization approach that combines the elevated spatial resolution of atomic force microscopy (AFM) with infrared (IR) ...

At the 2025 PDF Solutions Users Conference, CEO John Kibarian delivered a wide-ranging keynote that positioned the semiconductor industry at a pivotal inflection point, one driven by explosive AI ...

The 2026 SPIE Advanced Lithography + Patterning conference highlighted AI, both as a challenge and a solution. A case in point was the opening ...