No part of a product life cycle is immune to time-to-market pressures, and that includes wafer-level parametric tests on scribe-line test structures. Parallel parametric test is emerging as a ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

Testing multiple devices at the same time is not providing the equivalent reduction in overall test time due to a combination of test execution issues, the complexity of the devices being tested, and ...

Cleveland, Ohio — Keithley Instruments, Inc. has announced the availability of its Automated Characterization Suite (ACS) V3.2 software for semiconductor test and characterization at the device, wafer ...