For smartphones and computers to become smaller and faster, technologies capable of precisely controlling electrical properties at the nanoscale—beyond what is visible to the naked eye—are essential.

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale features ...

The developed high-speed three-dimensional scanning force microscopy enabled the measurement of 3D force distribution at solid-liquid interfaces at 1.6 s/3D image. With this technique, 3D hydration ...

Researchers at the Institute of Physics in Zagreb, Croatia, in collaboration with international partners, have showcased new methods for visualizing atomic-scale changes in advanced materials. How do ...

Thought LeaderProf. Dr. Sergei KalininProfessor & Chief Scientist in AI/ML for Physical SciencesUniversity of Tennessee & Pacific Northwest Laboratory In this interview, Prof. Dr. Sergei Kalinin ...

Researchers at Nano Life Science Institute (WPI-NanoLSI), Kanazawa University report in Small Methods the 3D imaging of a suspended nanostructure. The technique used is an extension of atomic force ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Park Systems Corp., the world's leading provider of atomic force microscopy (AFM) solutions, today announced the opening of ...