Nasdaq

Advantest Expands M4841 Handler with Active Thermal Control for Faster Device Throughput and Test Times

ATC 2.0 Option Enables Dynamic Multisite Sensing and Regulation of Device Temperature for Optimized Test of High-End Automotive SoCs TOKYO, Oct. 24, 2023 (GLOBE NEWSWIRE) -- Leading semiconductor test ...
Seeking Alpha

Advantest Expands Device Handler Offerings

TOKYO, Dec. 11, 2023 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced two new products designed to deliver advanced handling ...
Nasdaq

Advantest Introduces Next-Generation M5241 Memory Handler to Support High-Performance AI Memory Devices

TOKYO, Dec. 10, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the M5241 Memory Handler, its next-generation handler developed ...
Electronic Design

Tackling Next-Generation RF SOC Test

Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...