Catching all defects in chip packaging is becoming more difficult, requiring a mix of electrical tests, metrology screening, and various types of inspection. And the more critical the application for ...

A technical paper titled “Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy” was published by researchers at ...

image: THE INTRODUCTION OF DEFECTS INTO ELECTRODE MATERIALS FOR METAL-BASED BATTERIES IS AN EFFECTIVE STRATEGY TO IMPROVE BATTERY PERFORMANCE, DUE TO DEFECTIVE CATALYSTS HAVE THE ADVANTAGES OF HIGH ...

A recent review article published in Advanced Materials explored the potential of artificial intelligence (AI) and machine learning (ML) in transforming thermoelectric (TE) materials design. The ...

Researchers demonstrated the mussel-inspired reinforcement of graphene fibers for the improvement of different material properties. A research group applied polydopamine as an effective infiltrate ...

A joint research team has successfully identified, for the first time, the specific types of defects responsible for efficiency loss in silicon heterojunction (SHJ) solar cells. Subscribe to our ...

In a development that could lead to more advanced computer chips and light-emitting diodes, researchers from the University of California Los Angeles have created a new method for building ...

Each hose undergoes repeated pressure cycle testing and temperature stress evaluation to guarantee consistent braking performance, even under prolonged heavy-duty operation. This approach addresses ...

Tungsten carbide–cobalt (WC–Co) is prized for its hardness, but that same property makes it unusually difficult to shape. The current process is ...